Published on Central Microscopy Research Facility (https://cmrf.research.uiowa.edu)

JEOL JEM 2100F

Eckstein Medical Research Building - Room 84C

 

 

INSTRUMENT USAGE POLICY [1]

OPERATING INSTRUCTIONS [2]

 Instrument Specifications

  • 200 kV maximum accelerating voltage
  • Electron Gun Assembly: Schottky FEG Emission-Zr/W
  • Specimen Anti-contamination Trap
  • High Tilt Analytical Pole Piece (HTP)
  • Point-to-point resolution: 0.25 nm, stage tilt angle: +/-45 degrees for X, +/-30 degrees for Y tilt axes, EDS solid angle: 0.13 sr
  • Cryoholder
  • Double tilt Holder (Low background)
  • STEM (Scaning Transmission Electron Microscope) Images
  • Image Resolution: 1.5 nm with HTP (Bright Field STEM at 200 kV)
  • Low Mag: 100x to 15,000x
  • High Mag: 20,000x to 15,000,000x
  • JEOL bright field detector
  • Gatan high angle annular dark field (HAADF) detector
  • Gatan Tridiem post column parallel detection EELS with 2k x 2k PIXEL ULTRASCAN 1000 CCD CAMERA
  • NANOTRACE EDS DETECTOR WITH NORVAR WINDOW for detection of light elements, 30 mm straight Si(Li) crystal
  • 138 eV resolution
Source URL: https://cmrf.research.uiowa.edu/jeol-jem-2100f

Links:
[1] https://cmrf.research.uiowa.edu/sites/cmrf.research.uiowa.edu/files/JEOL%202100FTraining%20policy.pdf#overlay-context=jeol-jem-2100f
[2] https://cmrf.research.uiowa.edu/sites/cmrf.research.uiowa.edu/files/JEOL%202100%20User%20Instructions.pdf