Published on Central Microscopy Research Facility (https://cmrf.research.uiowa.edu)

Hitachi S-3400N

Trowbridge Hall - Room B21H

 

 

OPERATING INSTRUCTIONS [1]

Instrument Specifications

  • The Hitachi S-3400N SEM is a high performance, user-friendly scanning electron microscope with new improvements that allow the best results for a wide range of applications. Features include:
  • Unique VP-mode that allows microscopy of wet, oily and non-conductive samples in their natural state without the need of conventional sample preparation.
  • 3.0 nm resolution guaranteed in high vacuum mode or 4.0 nm in VP-mode.
  • Resolution
    • 3.0nm High Vacuum Mode
    • 4.0nm Variable Pressure Mode
  • Chamber
    • Accomodates 10 inch specimen
    • Three high TOA ports for EDS, WEDS, EBSP, XRF, etc.
  • Stage
    • Fully eucentric, 5 axis computer controlled motorized stage
  • Electron Gun
    • Variable Quad Bian Circuitry with SE Accelerator Plate
  • Automation
    • Full automation including "no touch" objective aperture alignment
  • Vacuum
    • Turbo Molecular Pump (TMP)
  • Detectors
Source URL: https://cmrf.research.uiowa.edu/hitachi-s-3400n

Links:
[1] https://cmrf.research.uiowa.edu/sites/cmrf.research.uiowa.edu/files/Hitachi%20S-3400N%20User%20Instructions.pdf
[2] https://cmrf.research.uiowa.edu/chromacl2%E2%84%A2
[3] https://cmrf.research.uiowa.edu/bruker-eds-system